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Volumn 16, Issue 19, 1997, Pages 3421-3427

Characterization of the non-stoichiometry in lanthanum oxyfluoride by FT-IR absorption, Raman scattering, X-ray powder diffraction and thermal analysis

Author keywords

Bond valence; Lanthanum oxyfluoride; Non stoichiometry; Raman scattering; Rietveld refinement; Thermoanalysis; X ray powder diffraction

Indexed keywords


EID: 0346089859     PISSN: 02775387     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0277-5387(97)00065-X     Document Type: Article
Times cited : (35)

References (28)
  • 2
    • 0003744842 scopus 로고
    • Chapman & Hall, London
    • nd edn., Chapman & Hall, London, 1995, pp. 187-189.
    • (1995) nd Edn. , pp. 187-189
    • Smart, L.1    Moore, E.2
  • 11
    • 0004326059 scopus 로고
    • Oxford University Press, Oxford
    • Young, R. A., ed., The Rietveld Method, Oxford University Press, Oxford, 1993.
    • (1993) The Rietveld Method
    • Young, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.