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Volumn 44, Issue 3 PART 1, 1997, Pages 736-742
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Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics
a b c e d g e e g e c e a c g e a a g e more.. |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0346060273
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.603742 Document Type: Article |
Times cited : (4)
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References (10)
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