Exciton-polariton behaviour in bulk and polycrystalline ZnO

Physica B: Condensed Matter

Volumn 340-342, Issue , 2003, Pages 230-234

  McGlynn, Enda ^a   Fryar, James ^a   Henry, Martin O ^a   Mosnier, Jean Paul ^a   Lunney, James G ^b   O'Mahony, Donagh ^b   DePosada, Eduardo ^b  

^a DUBLIN CITY UNIVERSITY   (Ireland)

^b TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

Excitons; Polaritons; Thin films; ZnO

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; EXCITONS; OSCILLATIONS; PHOTONS; RAMAN SPECTROSCOPY; RESONANCE; SINGLE CRYSTALS; SURFACE ROUGHNESS; THIN FILMS; WAVE INTERFERENCE; ZINC OXIDE;

POLARITONS; REFLECTANCE SPECTRA;

POLYCRYSTALLINE MATERIALS;

EID: 0346055328     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2003.09.019     Document Type: Conference Paper

References (15)

1. Look D.C. Mater. Sci. Eng. B. 80:2001;383.
2. Chen Y., et al. Mater. Sci. Eng. B. 75:2000;190.
3. Huang M.H., et al. Science. 292:2001;1897.
4. Heiland G., et al. Solid State Phys. 8:1959;191.
5. Reynolds D.C., et al. Phys. Rev. 140:1965;A1726.
6. Hopfield J.J., et al. Phys. Rev. Lett. 15:1963;22.
7. Hopfield J.J., et al. J. Phys. Chem. Solids. 12:1960;276.
8. Lagois J. Phys. Rev. B. 23:1981;5511 Lagois J. Phys. Rev. B. 16:1977;1699.
9. Lagois J. Phys. Rev. B. 23:1981;5511 Lagois J. Phys. Rev. B. 16:1977;1699.
10. Roy C., et al. Thin Solid Films. 436:2003;273.
11. G. Tobin, et al., In: A.R. Long, J.H. Davies (Eds.), Physics of Semiconductors 2002, Institute of Physics Conference Series Number 171, IOPP, Bristol, 2002, paper number H26.
12. Mita T., et al. Solid State Commun. 44:1982;1003.
13. Kiselev V.A., et al. Phys. Stat. Sol. B. 72:1975;161.
14. Hopfield J.J., et al. Phys. Rev. 132:1963;563.
15. Ivchenko E.L. Rashba E.I., Sturge M.D. Excitons. 1982;141-176 North-Holland, Amsterdam.