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Volumn 55, Issue 15, 1997, Pages 9564-9570

Characteristics, behavior, and identification of electron-induced defects in GaP

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EID: 0345906803     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.9564     Document Type: Article
Times cited : (2)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.