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Volumn 55, Issue 15, 1997, Pages 9564-9570
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Characteristics, behavior, and identification of electron-induced defects in GaP
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0345906803
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.55.9564 Document Type: Article |
Times cited : (2)
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References (21)
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