Optical properties of semiconductor nanostructures

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 4, 1997, Pages 1040-1044

  Reinecke, T L ^a   Knipp, P A ^b   Walck, S N ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b CHRISTOPHER NEWPORT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; ELECTRONS; MAXWELL EQUATIONS; NANOSTRUCTURED MATERIALS; PHOTONS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WELLS; SEMICONDUCTOR QUANTUM WIRES;

SCANNING ELECTRON MICROSCOPY MEASUREMENTS; SCHRODINGER EQUATION; SEMICONDUCTOR NANOSTRUCTURES;

OPTICAL PROPERTIES;

EID: 0345889333     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589389     Document Type: Article

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