Characterization of the Effects of Vanadium Traps in Cracking Catalysts by Imaging Secondary Ion Mass Spectrometry and Microactivity Test

Journal of the Chinese Chemical Society

Volumn 44, Issue 6, 1997, Pages 553-558

  Lin, Long Hui ^a   Chao, Kuei Jung ^a,b   Ling, Yong Chien ^a   Hwang, Jan Fu ^a   Hou, Liang Yuan ^a,b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b CPC CORPORATION   (Taiwan)

Author keywords

Microactivity test; SIMS; Vanadium trapping in cracking catalysts

Indexed keywords

EID: 0345877461     PISSN: 00094536     EISSN: None     Source Type: Journal    
DOI: 10.1002/jccs.199700085     Document Type: Article

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