X-ray topographic study of striation formation in layer growth of crystals from solutions

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 357, Issue 1761, 1999, Pages 2631-2649

  Smolsky, I L ^a,b   Voloshin, A E ^a   Zaitseva, N P ^b   Rudneva, E B ^a   Klapper, H ^c  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF BONN   (Germany)

Author keywords

Growth steps; Lattice parameter variation; Rapid crystal growth; Striation; X ray topography

Indexed keywords

EID: 0345877007     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.1999.0453     Document Type: Article

References (25)

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