Polyetheretherketone (PEEK) Surface Functionalization by Low-Energy Ion-Beam Irradiation under a Reactive O2 Environment and Its Effect on the PEEK/Copper Adhesives

Langmuir

Volumn 20, Issue 1, 2004, Pages 157-163

  Kim, Sehyun ^a,b   Lee, Ki Jun ^b   Seo, Yongsok ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVES; ATOMIC FORCE MICROSCOPY; COPPER; ION BOMBARDMENT; MOLECULES; PLASMAS; PLASTIC FILMS; POSITIVE IONS; SECONDARY ION MASS SPECTROMETRY; SHEAR STRENGTH; SURFACE ROUGHNESS; THERMODYNAMIC STABILITY; TOPOLOGY; X RAY PHOTOELECTRON SPECTROSCOPY;

OXYGENATION; SURFACE FUNCTIONALIZATION;

POLYETHER ETHER KETONES;

ADHESIVE AGENT; ARGON; COPPER; ION; KETONE; MACROGOL DERIVATIVE; OXYGEN; POLYETHERETHERKETONE;

ADSORPTION; ARTICLE; CHEMISTRY; INSTRUMENTATION; METHODOLOGY; RADIATION EXPOSURE; SPECTROMETRY; SURFACE PROPERTY; TIME;

ADHESIVES; ADSORPTION; ARGON; COPPER; IONS; KETONES; OXYGEN; POLYETHYLENE GLYCOLS; SPECTROMETRY, X-RAY EMISSION; SURFACE PROPERTIES; TIME FACTORS;

EID: 0345866699     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la035396h     Document Type: Article

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