4,4,4′,4′,7,7′-Hexamethyl-2,2′-spirobichroman

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 56, Issue 1, 2000, Pages 93-94

  Ejsmont, Krzysztof ^a   Kyzioł, Janusz ^a   Nowakowska, Ewa ^a   Zaleski, Jacek ^a  

^a UNIVERSITY OF OPOLE   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345853712     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270199013190     Document Type: Article

References (10)

1. Baker, W. & Besly, D. M. (1939). J. Chem. Soc. pp. 195-199.
2. Caruso, A. J. & Lee, J. L. (1997). J. Org. Chem. 62, 1058-1063.
3. Flippen, J. L., Karle, J. & Karle, I. L. (1970). J. Am. Chem. Soc. 92, 3749-3755.
4. Gall, J. H., MacCartney, M., MacNicol, D. D. & Mallinson, P. R. (1985). J. Inclusion Phenom. 3, 421-435.
5. Goldup, A. & Smith, G. W. (1970). Sep. Sci. 6, 791-817.
6. Kuma (1998). Kama Diffraction Software. Versions 8.1.0 and 8.1.1. Kuma Diffraction, Wrocław, Poland.
7. MacNicol, D. D. & Mallinson, P. R. (1983). J. Inclusion Phenom. 1, 169-174.
8. Sheldrick, G. M. (1990). SHELXTL. Siemens Analytica. X-ray Instruments Inc., Madison, Wisconsin, USA.
9. Sheldrick, G. M. (1997a). SHELXS97. Program for the Solution of Crystal Structures. University of Göttingen, Germany.
10. Sheldrick, G. M. (1997b). SHELXL97. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.