Plastic deformation of single crystals of NbSi2 with the C40 structure

Materials Science and Engineering: A

Volumn 239-240, Issue 1-2, 1997, Pages 69-74

  Moriwaki, M ^a   Ito, K ^a,b   Inui, H ^a   Yamaguchi, M ^a  

^a KYOTO UNIVERSITY   (Japan)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

C40 structure; Dislocation; High resolution transmission electron microscopy; NbSi2; Portevin Le Chatelier effect; Transition metal silicide

Indexed keywords

CRYSTAL GROWTH; CRYSTAL ORIENTATION; PLASTIC FLOW; SHEAR STRENGTH; SINGLE CRYSTALS; STRAIN RATE; STRESS ANALYSIS; THERMAL EFFECTS;

CRITICAL RESOLVE SHEAR STRESS (CRSS); NIOBIUM SILICIDE;

NIOBIUM ALLOYS;

EID: 0345847850     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(97)00562-5     Document Type: Article

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