Trap-Auger recombination in silicon of low carrier densities

Applied Physics Letters

Volumn 50, Issue 12, 1987, Pages 745-747

  Landsberg, P T ^a  

^a UNIVERSITY OF FLORIDA   (United States)

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EID: 0345842854     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.98086     Document Type: Article

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