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Wuli Xuebao/Acta Physica Sinica

Volumn 50, Issue 5, 2001, Pages 992-993

Structural transition in organic thin films for nanometer scale data recording

(5) Shi, Dong Xia a Ba, De Chun a Pang, Shi Jin b Song, Yan Lin c Gao, Hong Jun b,c

a NORTHEASTERN UNIVERSITY (China)

b INSTITUTE OF PHYSICS (China)

c INSTITUTE OF GEOLOGY AND GEOPHYSICS (China)

Author keywords

Nanometer scale data recording; Organic thin films; Scanning tunneling microscopy (STM); Structural transition

Indexed keywords

EID: 0345822017 PISSN: 10003290 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (1)

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