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Volumn 14, Issue 1-4, 1999, Pages 152-158
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Computer simulation of point defects in fee metals using EAM potentials
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Author keywords
Activation energy; Embedded atom potentials; Fee metals; Molecular dynamics; Point defect
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Indexed keywords
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EID: 0345770671
PISSN: 09270256
EISSN: None
Source Type: Journal
DOI: 10.1016/s0927-0256(98)00100-1 Document Type: Article |
Times cited : (7)
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References (7)
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