Fusion energy with lasers, direct drive targets, and dry wall chambers

Nuclear Fusion

Volumn 43, Issue 12, 2003, Pages 1693-1709

  Sethian, J D ^a   Friedman, M ^a   Lehmberg, R H ^a   Myers, M ^a   Obenschain, S P ^a   Giuliani, J ^a   Kepple, P ^a   Schmitt, A J ^a   Colombant, D ^a   Gardner, J ^a   Hegeler, F ^b   Wolford, M ^c   Swanekamp, S B ^d   Weidenheimer, D ^d   Welch, D ^e   Rose, D ^e   Payne, S ^f   Bibeau, C ^f   Baraymian, A ^f   Beach, R ^f   Schaffers, K ^f   Freitas, B ^f   Skulina, K ^f   Meier, W ^f   Latkowski, J ^f   Perkins, L J ^f   Goodin, D ^g   Petzoldt, R ^g   Stephens, E ^g   Najmabadi, F ^h   Tillack, M ^h   Raffray, R ^h   Dragojlovic, Z ^h   Haynes, D ⁱ   Peterson, R ⁱ   Kulcinski, G ⁱ   Hoffer, J ^j   Geller, D ^j   Schroen, D ^k   Streit, J ^k   Olson, C ^l   Tanaka, T ^l   Renk, T ^l   Rochau, G ^l   Snead, L ^m   Ghoneim, N ⁿ   Lucas, G ^o   more..

^a NAVAL RESEARCH LABORATORY   (United States)

^b Commonwealth Technology Inc ^*  (United States)

^c SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^d TITAN CORPORATION   (United States)

^e MISSION RESEARCH CORPORATION   (United States)

^f LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^g GENERAL ATOMICS   (United States)

^h UNIVERSITY OF CALIFORNIA   (United States)

ⁱ UNIVERSITY OF WISCONSIN MADISON   (United States)

^j LOS ALAMOS NATIONAL LABORATORY   (United States)

^k SCHAFER CORPORATION   (United States)

^l SANDIA NATIONAL LABORATORIES   (United States)

^m OAK RIDGE NATIONAL LABORATORY   (United States)

ⁿ UNIVERSITY OF CALIFORNIA   (United States)

^o UNIVERSITY OF CALIFORNIA   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DRIFT CHAMBERS; GAS LASERS; LASER DAMAGE; PARTICLE BEAM TRACKING; PUMPING (LASER); SOLID STATE LASERS; SYSTEMS ANALYSIS; TARGETS;

DIODE PUMPED SOLID STATE LASERS; DIRECT DRIVE TARGETS; DRY WALL CHAMBERS; FUSION ENERGY; KRYPTON FLUORIDE GAS LASERS; LASER DAMAGE THRESHOLD;

INERTIAL CONFINEMENT FUSION;

EID: 0345761296     PISSN: 00295515     EISSN: None     Source Type: Journal    
DOI: 10.1088/0029-5515/43/12/015     Document Type: Article

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