Measuring electrochemically induced surface stress with an atomic force microscope

Journal of Physical Chemistry

Volumn 99, Issue 43, 1995, Pages 15728-15732

  Raiteri, Roberto ^a,b   Butt, Hans Jürgen ^a  

^a MAX PLANCK INSTITUTE OF BIOPHYSICS   (Germany)

^b UNIVERSITY OF GENOA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345756606     PISSN: 00223654     EISSN: None     Source Type: Journal    
DOI: 10.1021/j100043a008     Document Type: Article

References (30)