Sphere Model for Quantitative XPS Analysis of Supported Systems

Physics of Low-Dimensional Structures

Volumn 2001, Issue 9-10, 2001, Pages 95-102

  Plyuto, I V ^a   Shpak, A P ^a  

^a INSTITUTE OF METAL PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345733131     PISSN: 02043467     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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2. H.P.C.E. Kuipers, H.C.E. Leuven and W.M. Visser, Surf. Interface Anal., 8 (1986) 235.
3. A. Cimino, D. Gazzolli, M. Valigi, J. Electron Spectrosc. Relate. Phenom., 67 (1994) 429.
4. A. Frydman, D.J. Caster, M. Schmal, C.T. Campbell, J. Catal., 157 (1995) 133.
5. I.V. Plyuto, A.P. Shpak, Characterization of disperse heterogeneous systems by X-ray photoelectron spectroscopy, Naukova Dumka, Kyiv, 2000.
6. I.V. Plyuto, A.P. Shpak, S.V. Milovzorova, Application of the XPS Technique for Analyzing the Surface Composition of Supported Systems, Preprint of the Institute of Physics of Metals of the NAS of Ukraine, Kiev, 1991 (in Russian).
7. I.V. Plyuto, A.P. Shpak, Salient Features of the Quantitative Analysis of the Surface Composition of Supported Systems by the XPS Technique, Preprint of the Institute of Physics of Metals of the NAS of Ukraine, Kiev, 1990 (in Russian).