Fabrication of a narrow gold wire using scanning tunneling microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 6 SUPPL. B, 1997, Pages 3832-3833

  Okamoto, Hiroshi ^a   Itakura, Akiko ^a   Yakabe, Taro ^a   Nejoh, Hitoshi ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Atomic device; Electro migration; Narrow gold wire; Scanning tunneling microscopy

Indexed keywords

EID: 0345631017     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.3832     Document Type: Article

References (1)

1. H. J. Mamin, P. H. Guethner and D. Ruger: Phys. Rev. Lett. 65 (1990) 2418.