Electrical properties of (Ca,Sr)Bi4Ti4O15 thin films fabricated using a chemical solution deposition method

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 9 B, 2003, Pages 5990-5993

  Uchida, Hiroshi ^a   Sakurai, Keiko ^a   Okada, Isao ^a   Matsuda, Hirofumi ^b   Iijima, Takashi ^b   Kojima, Takashi ^c   Watanabe, Takayuki ^c   Funakubo, Hiroshi ^c  

^a SOPHIA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Calcium strontium bismuth titanate; Chemical solution deposition (CSD); Dielectric constant; Dielectrics; Polycrystalline film; Solid solution

Indexed keywords

BISMUTH COMPOUNDS; COMPOSITION EFFECTS; CRYSTAL ORIENTATION; DEPOSITION; ELECTRIC PROPERTIES; FREQUENCIES; PERMITTIVITY; POLYCRYSTALLINE MATERIALS; SILICA; SOLID SOLUTIONS; SUBSTRATES; THIN FILMS;

CALCIUM STRONTIUM BISMUTH TITANATE; CHEMICAL SOLUTION DEPOSITION;

FERROELECTRIC MATERIALS;

EID: 0345603681     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.5990     Document Type: Article

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