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Volumn 15, Issue 3, 1997, Pages 485-492

Surface chemical analysis: Comparing and exchanging data

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0345590170     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580878     Document Type: Article
Times cited : (5)

References (68)
  • 6
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    • VAM Bull. 14, 2 (1996); 13, 2 (1995); available from J. Fleming, LGC, Teddington, Middlesex TW11 0LY, UK.
    • (1996) VAM Bull. , vol.14 , pp. 2
  • 7
    • 0041037570 scopus 로고
    • VAM Bull. 14, 2 (1996); 13, 2 (1995); available from J. Fleming, LGC, Teddington, Middlesex TW11 0LY, UK.
    • (1995) VAM Bull. , vol.13 , pp. 2
  • 8
    • 85033312523 scopus 로고    scopus 로고
    • available from J. Fleming, LGC, Teddington, Middlesex TW11 0LY, UK
    • VAM Bull. 14, 2 (1996); 13, 2 (1995); available from J. Fleming, LGC, Teddington, Middlesex TW11 0LY, UK.
  • 38
    • 0000014708 scopus 로고
    • Auger and X-ray Photoelectron Spectroscopy, edited by D. Briggs and M. P. Seah Wiley, Chichester
    • P. M. A. Sherwood, in Practical Surface Analysis. Vol. 1, Auger and X-ray Photoelectron Spectroscopy, edited by D. Briggs and M. P. Seah (Wiley, Chichester, 1990), p. 555.
    • (1990) Practical Surface Analysis , vol.1 , pp. 555
    • Sherwood, P.M.A.1
  • 43
    • 5844328895 scopus 로고
    • edited by A. Benninghoven, K. T. F. Janssen, J. Tumpner, and H. W. Werner Wiley, Chichester
    • K. Miethe, Secondary Ion Mass Spectrometry, SIMS VIII, edited by A. Benninghoven, K. T. F. Janssen, J. Tumpner, and H. W. Werner (Wiley, Chichester, 1992), p. 399.
    • (1992) Secondary Ion Mass Spectrometry, SIMS VIII , pp. 399
    • Miethe, K.1
  • 50
    • 0003776069 scopus 로고    scopus 로고
    • edited by A. Benninghoven, Y. Nihei, R. Shimizu, and H. W. Werner Wiley, Chichester
    • K. Miethe and E.-H. Cirlin, Secondary Ion Mass Spectrometry. SIMS IX, edited by A. Benninghoven, Y. Nihei, R. Shimizu, and H. W. Werner (Wiley, Chichester, 1994), p. 698.
    • (1994) Secondary Ion Mass Spectrometry. SIMS IX , pp. 698
    • Miethe, K.1    Cirlin, E.-H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.