Transientmeasurements with an ultrafast scanning tunneling microscope

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Keil, U D ^a   Jensen, J R ^a   Hvam, J M ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE COUPLINGS; DELAY TIME; GOLD LAYER; LASER INDUCED; LOW-TEMPERATURE-GROWN GAAS; PHOTOCONDUCTIVE SWITCHES; PROBE BEAM; PUMP BEAMS; SAPPHIRE SUBSTRATES; SEMICONDUCTOR LAYERS; TEMPORAL INFORMATION; TRANSIENT SIGNAL; TRANSMISSION LINE; TUNNELING GAP; ULTRAFAST SCANNING TUNNELING MICROSCOPE;

BANDPASS FILTERS; ELECTRIC LINES; GALLIUM ALLOYS; PHOTOCONDUCTING MATERIALS; PROBES; SEMICONDUCTOR LASERS; TRANSMISSION LINE THEORY; WIND TUNNELS;

ULTRAFAST LASERS;

EID: 0345578449     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051092     Document Type: Article

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