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Volumn 46, Issue 5, 2002, Pages 81-90
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Transmission electron microscopy with high resolution in nanotechnological investigations
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0345549334
PISSN: 03730247
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (12)
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References (0)
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