Small angle X-ray scattering measurements for expanded fluid Se near the critical point

Journal of Non-Crystalline Solids

Volumn 250-252 (II), Issue , 1999, Pages 531-536

  Inui, M ^a   Oh'ishi, Y ^a   Nakaso, I ^a   Kazi, M H ^a   Tamura, K ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; POLYCRYSTALLINE MATERIALS; SAPPHIRE; X RAY SCATTERING; X RAY SPECTROSCOPY;

ORNSTEIN-ZERNIKE PLOT; SMALL ANGLE X RAY SCATTERING (SAXS) SPECTROSCOPY;

SEMICONDUCTING SELENIUM;

EID: 0345504837     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(99)00286-0     Document Type: Article

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