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Volumn 68, Issue 23, 1992, Pages 3432-3435
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Direct measurement of the van der Waals interaction between an atom and its images in a micron-sized cavity
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0345472315
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.68.3432 Document Type: Article |
Times cited : (197)
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References (21)
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