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Volumn 3122, Issue , 1997, Pages 426-434

Laser reflectance monitoring of the nucleation and growth of CdTe on basal plane sapphire substrates for focal plane arrays

Author keywords

Cadmium telluride; Feedback control; Focal plane arrays; In situ reflectance

Indexed keywords

BUFFER LAYERS; CADMIUM; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CORUNDUM; EXTRAPOLATION; FEEDBACK; FEEDBACK CONTROL; FOCAL PLANE ARRAYS; FOCUSING; GROWTH (MATERIALS); LASERS; NUCLEATION; PROBES; REFLECTION; REMOTE SENSING; SAPPHIRE; STACKING FAULTS; TELLURIUM COMPOUNDS; THICKNESS MEASUREMENT; VEGETATION;

EID: 0345459386     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.279002     Document Type: Conference Paper
Times cited : (3)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.