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Volumn 3122, Issue , 1997, Pages 426-434
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Laser reflectance monitoring of the nucleation and growth of CdTe on basal plane sapphire substrates for focal plane arrays
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Author keywords
Cadmium telluride; Feedback control; Focal plane arrays; In situ reflectance
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Indexed keywords
BUFFER LAYERS;
CADMIUM;
CADMIUM ALLOYS;
CADMIUM COMPOUNDS;
CORUNDUM;
EXTRAPOLATION;
FEEDBACK;
FEEDBACK CONTROL;
FOCAL PLANE ARRAYS;
FOCUSING;
GROWTH (MATERIALS);
LASERS;
NUCLEATION;
PROBES;
REFLECTION;
REMOTE SENSING;
SAPPHIRE;
STACKING FAULTS;
TELLURIUM COMPOUNDS;
THICKNESS MEASUREMENT;
VEGETATION;
BUFFER LAYER GROWTH;
CADMIUM TELLURIDE;
GROWTH MODES;
GROWTH PROCESSES;
GROWTH TIME;
HALFWAVE LENGTH;
HE-NE LASERS;
IN-SITU REFLECTANCE;
LASER LIGHT;
NUCLEATION TEMPERATURES;
PROBE WAVELENGTH;
SAPPHIRE SUBSTRATES;
FILM GROWTH;
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EID: 0345459386
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.279002 Document Type: Conference Paper |
Times cited : (3)
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References (6)
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