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Volumn 10, Issue 5, 2003, Pages 826-841

Charge Motion in Technical Insulators: Facts, Fancies and Simulations

Author keywords

Conduction; Insulators; Modeling; Oscillations; Simulation; Space charge; Surface conduction

Indexed keywords

ALGORITHMS; ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CHARGE CARRIERS; COMPUTER SIMULATION; CONTINUUM MECHANICS; ELECTRIC CONDUCTIVITY; ELECTRIC SPACE CHARGE; ELECTRODES; IONIC CONDUCTION; IONIZATION; SCANNING ELECTRON MICROSCOPY;

EID: 0345414678     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2003.1237332     Document Type: Conference Paper
Times cited : (33)

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