Electric-field-induced insulator-metal transition in Pr 0.5Ca0.5MnO3 thin films in ramp-type junctions

Journal of Applied Physics

Volumn 94, Issue 10, 2003, Pages 6549-6551

  Murakami, T ^a   Sakai, J ^a   Imai, S ^a  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC INSULATORS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTRON CYCLOTRON RESONANCE; FERROMAGNETIC MATERIALS; MAGNETIC FIELD EFFECTS; PEROVSKITE; PRASEODYMIUM COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SINGLE CRYSTALS; STACKING FAULTS; X RAY DIFFRACTION ANALYSIS;

MULTIFILAMENTARY PATHS; ORBITAL ORDERS;

THIN FILMS;

EID: 0345377631     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1619574     Document Type: Article

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