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Volumn 83, Issue 18, 2003, Pages 3833-3835
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Dielectrophoresis and electrohydrodynamics-mediated fluidic assembly of silicon resistors
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Author keywords
[No Author keywords available]
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Indexed keywords
CHROMIUM;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC RESISTANCE;
ELECTROHYDRODYNAMICS;
ELECTROPHORESIS;
GOLD;
RESISTORS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SILICON ON INSULATOR TECHNOLOGY;
SILICON WAFERS;
SINGLE CRYSTALS;
WATER;
CURRENT VOLTAGE MEASUREMENT;
DEIONIZED WATER;
DIELECTROPHORESIS;
FLUIDIC ASSEMBLY;
GOLD CHROMIUM LAYERS;
SILICON ON INSULATOR WAFER;
SINGLE CRYSTAL SILICON DEVICES;
SEMICONDUCTING SILICON;
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EID: 0345359868
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1624642 Document Type: Article |
Times cited : (25)
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References (11)
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