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Volumn 48, Issue 12, 2003, Pages 1655-1660

The effect of yttrium addition on the oxidation resistance of EPM TiAl-based intermetallics

Author keywords

Intermetallic; Microstructure; Oxidation resistance; Yttrium

Indexed keywords

ALUMINA; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MICROSTRUCTURE; OXIDATION RESISTANCE; YTTRIUM;

EID: 0345352842     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(03)00134-9     Document Type: Article
Times cited : (44)

References (19)
  • 1
    • 0024701113 scopus 로고
    • Kim Y.W. JOM. 41(7):1989;24.
    • (1989) JOM , vol.41 , Issue.7 , pp. 24
    • Kim, Y.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.