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Journal of Applied Physics

Volumn 85, Issue 3, 1999, Pages 1317-1321

Measurement of the electric screening field in Bi12TiO20

(7) Cedilnik, G a Esselbach, M a Kiessling, A a Kowarschik, R a Kamshilin, A A b Shamonina, E c Ringhofer, K H c

a FRIEDRICH SCHILLER UNIVERSITY JENA (Germany)

b UNIVERSITY OF EASTERN FINLAND (Finland)

c UNIVERSITY OF OSNABRÜCK (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345347681 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.369262 Document Type: Article

Times cited : (3)

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