Anti-plane interfacial Yoffe-crack between a piezoelectric and two orthotropic layers

European Journal of Mechanics, A/Solids

Volumn 21, Issue 3, 2002, Pages 483-492

  Lee, Jung Seek ^a   Kwon, Soon Man ^a   Lee, Kang Yong ^a   Kwon, Jong Ho ^a  

^a Yonsei University   (South Korea)

Author keywords

Field intensity factors; Integral transforms; Interfacial moving crack; Orthotropic material; Piezoelectric material; Stress intensity factor

Indexed keywords

COUPLINGS; CRACK INITIATION; DYNAMIC RESPONSE; ELASTICITY; ELECTRIC LOADS; FOURIER TRANSFORMS; INTEGRAL EQUATIONS; NUMERICAL METHODS; SHEAR DEFORMATION; STRESS INTENSITY FACTORS;

FIELD INTENSITY FACTORS; INTEGRAL TRANSFORMS; INTERFACIAL MOVING CRACKS; ORTHOTROPIC MATERIALS;

PIEZOELECTRIC MATERIALS;

EID: 0345272792     PISSN: 09977538     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0997-7538(02)01212-3     Document Type: Article

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