Quantitative X-ray photoelectron analysis of chemically modified solid surfaces

Vestnik Moskovskogo Universiteta Seriya 2 Khimiya

Volumn 39, Issue 6, 1998, Pages 394-398

  Alov, N V ^a   Oskolok, K V ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345250472     PISSN: 05799384     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

1. Seach M.P. // Surf. Interface Anal. 1980. 2. P. 222.
2. Scharli M., Brunner J. // J. Electron Spectrosc. Relat Phenom. 1983. 31. P. 323.
3. Cross Y.M., Castle J.E. // J. Electron Spectrosc. Relat. Phenom. 1981. 22. P. 53.
4. Powell G.J. // J. Electron Spectrosc. Relat. Phenom. 1988. 47. P. 197.
5. Tracy J.C. // J. Vac. Sci. Technol. 1974. 11. P. 280.
6. Tanuma S., Powell G.J., Penn D.R. // Surf. Interface Anal. 1988. 11. P. 577.
7. Alov N.V., Oskolok K.V. / Proc. Int. Congr. Anal. Chem. Moscow, Russia, June 15-21, 1997. 2. L-69.
8. Ebel H., Zuba G., Ebel M.F. // J. Electron Spectrosc. Relat. Phenom. 1983. 31. P. 123.
9. Ebel H., Ebel M.F, Baldomf P., Jablonskii A. // Surf. Interface Anal. 1987. 12. P. 172.