A Telepresence Microscopy Research Session In The DOE2000 Materials Microcharacterization Collaboratory

Microscopy and Microanalysis

Volumn 4, Issue 2 S, 1998, Pages 20-21

  Allard, L F ^a   Voelkl, E ^a   Nolan, T A ^a   Narula, C K ^b   Montreuil, C ^b   Bigelow, W C ^b   Mansfield, J F ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b FORD RESEARCH LABORATORY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345240053     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600020225     Document Type: Article

References (4)

1. M. C. Wright, this Proceedings.;
2. L. F. Allard, K. S. Ailey, A. K. Datye and W. C. Bigelow, Proceedings MSA(1997), Springer, 559-560;
3. E. Voelkl, L.F. Allard, T.A. Nolan, D. Hill and M. Lehmann, Scanning Vol. 19, 286-291 (1997);
4. Research sponsored by DOE Office of Mathematical, Information and Computational Sciences and Office of Transportation Technologies, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp.