Computer processing of CBED and SAD patterns on MS Windows 95 operating platform

Journal of Computer-Assisted Microscopy

Volumn 9, Issue 2, 1997, Pages 125-126

  Buršík, Jiří ^a  

^a INSTITUTE OF PHYSICS OF MATERIALS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345183961     PISSN: 10407286     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)

1. Buxton, B. F., Eades, J. A., Steeds, J. W., and Rackham, G. M. (1976). Phil. Trans. R. S. L. 281:171.
2. Kelly, P. M., Jostsons, A., Blake, R. G., and Napier, J. G. (1975). Phys. Stat. Sol. (a) 31:771.
3. Mighell, A. D., and Himes, V. L. (1986). Acta Cryst. A42:101.
4. Tanaka, M., and Terauchi, M. (1985). CBED, JEOL-Maruzen, Tokyo.