Accuracy improvement of impedance measurements by using the self-calibration

Measurement: Journal of the International Measurement Confederation

Volumn 25, Issue 3, 1999, Pages 213-225

  Liu, Ji Gou ^a,b   Frühauf, Uwe ^a   Schönecker, Andreas ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b FRAUNHOFER INSTITUTE FOR CERAMIC TECHNOLOGIES AND SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DIELECTRIC MATERIALS; EFFICIENCY; ELECTRIC FIELD EFFECTS; ELECTRIC IMPEDANCE MEASUREMENT; ERROR ANALYSIS; ERROR CORRECTION; MEASUREMENT ERRORS; RESISTORS;

ERROR SELF CORRECTION; SELF CALIBRATION MEASURING METHODS;

CALIBRATION;

EID: 0345148328     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(99)00005-6     Document Type: Article

References (16)

1. Ibrahim K.M., Abdul-Karim M.A.H. Digital impedance measurement by generating two waves. IEEE Trans. Instrum. Meas. IM-34:(1):1985;2-5.
2. Waltrip B.C., Oldham N.M. Digital impedance Bridge, IEEE Trans. Instrum. Meas. 44:(2):1995;436-439.
3. Witt T.J., Reymann D., Avrons D. An accurate 10 kΩ resistance measurement system. IEEE Trans. Instrum. Meas. 40:(2):1991;271-273.
4. Liu J.-G., Schönecker A., Keitel U. Measurement of high field impedance on electro-ceramic materials. Proceeding of the International Conference and Exhibition Micro Materials, Berlin, Germany :April 16-18, 1997;622-625.
5. Schönecker A., Liu J.-G., Keitel U., Gesemann H.-J. Impedance measurement of dielectric materials under high electrical field intensities. Proceedings of the Symposium "Long-term Behaviour of Functional Ceramics", Dresden, Germany :May 22-23, 1997;307-317.
6. Heuermann H., Schiek B. Error corrected impedance measurements with a network analyzer. IEEE Trans. Instrum. Meas. 44:(2):1995;295-299.
7. Angrisani L., Baccigalupi A., Pietrosanto A. A digital signal-processing instrument for impedance measurement. IEEE Trans. Instrum. Meas. 45:(6):1996;930-934.
8. Liu J.-G., Schönecker A., Frühauf U., Keitel U., Gesemann H.J. Application of discrete Fourier transform to electronic measurements. Proceedings of the First International Conference on Information, Communications & Signal Processing, Singapore :9-12 Sept. 1997;1257-1261.
9. Liu J.-G., Schönecker A. Recursive self-correction algorithm of discrete Fourier transform and application to electrical measurements. The 43rd International Scientific Colloquium, Ilmenau, Germany :September 21-24, 1998;515-520.
10. Liu J.-G., Schönecker A., Frühauf U. Recursive self-correction discrete Fourier transform and application to impedance measurement. The 6th Biennial Conference on Electronics and Microsystems Technology, Tallinn, Estonia :October 7-9, 1998;109-115.
11. G. Schaumburg, New broadband dielectric spectrometers, Dielectrics Newsletter, July 1994, pp. 8-12.
12. Frühauf U. Self-diagnosis and self-calibration features in electronic measurement systems. Proceedings of the International Symposium on New Measurement and Calibration Methods of Electrical Quantities and Instruments (8th IMEKO TC-4 Symposium), Budapest :16-17 September 1996;81-87.
13. Liu J.-G., Schönecker A., Frühauf U., Keitel U. Self-calibration methods and application to impedance measurement. International Conference on Soft Computing and Measurement, St. Petersburg, Russia :June 22-26, 1998.
14. Liu J.-G., Frühauf U. Self-calibration in measurements of electrical quantities by using Lagrange-interpolation. IMEKO TC-4 Symposium on Development in Digital Measuring Instrumentation and 3rd Workshop on ADC Modeling and Testing, Naples, Italy :September 17-18, 1998;493-498.
15. Liu J.-G., Schönecker A. Precise impedance measurement of dielectric materials under high field intensities by using self-calibration, IMEKO TC-4 Symposium on Development in Digital Measuring Instrumentation and 3rd Workshop on ADC Modeling and Testing, Naples, Italy. September 17-18, 1998;9-13.
16. DIN ISO 10012-1, Quality assurance requirements for measuring equipment, Part 1: Meteorological confirmation system for measuring equipment, August 1992.