Crystal Structure of High Temperature Phase and Ionic Conductivity Mechanism of CuHgSX (X = Cl, Br)

Bulletin of the Chemical Society of Japan

Volumn 76, Issue 11, 2003, Pages 2111-2115

  Moro'oka, Masakazu ^a   Ohki, Hiroshi ^a   Yamada, Koji ^a   Okuda, Tsutomu ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ENTHALPY; ENTROPY; HIGH TEMPERATURE APPLICATIONS; IONIC CONDUCTION; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION ANALYSIS;

CHARGE DENSITY; MAXIMUM ENTROPY METHOD (MEM);

COPPER COMPOUNDS;

BROMINE; CHLORIDE; COPPER DERIVATIVE; MERCURY;

ARTICLE; CONCENTRATION (PARAMETERS); CRYSTAL STRUCTURE; DENSITY; ENTROPY; HIGH TEMPERATURE PROCEDURES; ION CONDUCTANCE; TEMPERATURE DEPENDENCE; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

EID: 0345096467     PISSN: 00092673     EISSN: None     Source Type: Journal    
DOI: 10.1246/bcsj.76.2111     Document Type: Article

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