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Volumn 56, Issue 1, 1999, Pages 217-222

Studies on the system AlVMoO7-V2O5

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; DIFFERENTIAL THERMAL ANALYSIS; VANADIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

EID: 0345073156     PISSN: 13886150     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (17)
  • 16
    • 0003495856 scopus 로고    scopus 로고
    • International Center for Diffraction Data, Swarthmore (USA), 1989, File Nos. 35-0609; 9-0387; 39-0276; 31-0034; 13-0373; 34-0527; 23-0764
    • Powder Diffraction File, International Center for Diffraction Data, Swarthmore (USA), 1989, File Nos. 35-0609; 9-0387; 39-0276; 31-0034; 13-0373; 34-0527; 23-0764.
    • Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.