Scanning tunnelling microscopy studies of silicides

Journal of Physics D: Applied Physics

Volumn 32, Issue 15, 1999, Pages

  Bennett, P A ^a   Von Kanel H ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; GROWTH (MATERIALS); INTERFACES (MATERIALS); KINETIC THEORY; METALLIZING; MOLECULAR STRUCTURE; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SCATTERING; SCHOTTKY BARRIER DIODES; STOICHIOMETRY; SURFACES;

ATOMIC SCALE PRECURSORS; BALLISTIC ELECTRON EMISSION MICROSCOPY; DEFECT SCATTERING; INELASTIC SCATTERING; NANOSCALE METALLIZATION; SILICIDES; SURFACE RECONSTRUCTIONS;

SILICON COMPOUNDS;

EID: 0345073120     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/15/201     Document Type: Article

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