Probing the organization of adsorbed protein layers: Complementarity of atomic force microscopy, X-ray photoelectron spectroscopy and radiolabeling

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 638-643

  Dufrêne, Yves F ^a   Marchal, Thibault G ^a   Rouxhet, Paul G ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

Adsorbed protein layers; Atomic force microscopy; Radiolabeling; X ray photoelectron spectroscopy

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; DRYING; MATHEMATICAL MODELS; MECHANICAL PROPERTIES; POLYMERS; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

ADSORBED PROTEIN LAYERS; POLYMER SUBSTRATA; RADIOCHEMICAL MEASUREMENTS; RADIOLABELING;

COLLAGEN;

EID: 0345073087     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00881-2     Document Type: Article

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