An investigation of the critical thickness of film rupture and drainage phenomena using dual wavelength ellipsometry

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 143, Issue 1, 1998, Pages 41-51

  Goodall, D G ^a   Gee, M L ^a   Stevens, G ^a   Perera, J ^a   Beaglehole, D ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

Author keywords

Critical film thickness; Ellipsometry; Film rupture

Indexed keywords

DROP FORMATION; ELLIPSOMETRY; INTERFACES (MATERIALS); THICKNESS MEASUREMENT; THIN FILMS; VAN DER WAALS FORCES; VISCOSITY;

CRITICAL FILM THICKNESS; DUAL WAVELENGTH ELLIPSOMETRY; FILM DRAINAGE; FILM RUPTURE;

SURFACE PHENOMENA;

POLYMER; WATER;

ARTICLE; ELLIPSOMETRY; EMULSION; FILM; PRIORITY JOURNAL; VISCOSITY;

EID: 0345020407     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(98)00500-7     Document Type: Article

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