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1
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0027555196
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A new method for measuring adhesion strength of IC molding compounds
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(in Japanese)
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Nishimura, A., Hirose, I., and Tnanaka, N., 1993, "A New Method for Measuring Adhesion Strength of IC Molding Compounds" (in Japanese), Trans. Jpn. Soc. Mech. Eng., Ser. A, 59(559), pp. 620-626.
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(1993)
Trans. Jpn. Soc. Mech. Eng., Ser. A
, vol.59
, Issue.559
, pp. 620-626
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Nishimura, A.1
Hirose, I.2
Tnanaka, N.3
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2
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0028515369
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Measurement of IC molding compound adhesion strength and prediction of interface delamination within package
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(in Japanese)
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Tanaka, N., and Nishiura, A., 1994, "Measurement of IC Molding Compound Adhesion Strength and Prediction of Interface Delamination Within Package" (in Japanese), Trans. Jpn. Soc. Mech. Eng., Ser. A, 60(577), pp. 1992-1999.
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(1994)
Trans. Jpn. Soc. Mech. Eng., Ser. A
, vol.60
, Issue.577
, pp. 1992-1999
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Tanaka, N.1
Nishiura, A.2
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3
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5844362916
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Measurement of mixed mode fracture toughness of an interface crack in electronic devises
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Ikeda, T., Komohara, Y., and Miyazaki, N., 1997, "Measurement of Mixed Mode Fracture Toughness of an Interface Crack in Electronic Devises," Advances in Electronic Packaging, ASME EEP-Vol. 19, No. 2, pp. 1137-1444.
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(1997)
Advances in Electronic Packaging, ASME
, vol.EEP-Vol. 19
, Issue.2
, pp. 1137-1444
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Ikeda, T.1
Komohara, Y.2
Miyazaki, N.3
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4
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0023560046
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Life estimation for IC plastic packages under temperature cycling based on fracture mechnics
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Nishimura, A., Tatemichi, A., Miura, H., and Sakamoto, T., 1987, "Life Estimation for IC Plastic Packages under Temperature Cycling Based on Fracture Mechnics," IEEE Trans. Compon., Hybrids, Manuf. Technol., CHMT-12, No. 4, pp. 637-642.
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(1987)
IEEE Trans. Compon., Hybrids, Manuf. Technol.
, vol.CHMT-12
, Issue.4
, pp. 637-642
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Nishimura, A.1
Tatemichi, A.2
Miura, H.3
Sakamoto, T.4
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5
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0024905052
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Effect of lead frame material on plastic-encapsulated IC package cracking under temperature cycling
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Nishimura, A., Kawai, S., and Murakami, G., 1989, "Effect of Lead Frame Material on Plastic-Encapsulated IC Package Cracking Under Temperature Cycling," IEEE Trans. Compon., Hybrids, Manuf. Technol., 12, No. 4, pp. 639-645.
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(1989)
IEEE Trans. Compon., Hybrids, Manuf. Technol.
, vol.12
, Issue.4
, pp. 639-645
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Nishimura, A.1
Kawai, S.2
Murakami, G.3
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6
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0024607410
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A study of package cracking during the reflow soldering process
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(in Japanese)
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Kitano, M., Kawai, S., Nishimura, A., and Nishi, K., 1989, "A Study of Package Cracking During the Reflow Soldering Process" (in Japanese), Trans. Jpn. Soc. Mech. Eng., Ser. A, 55(510), pp. 356-363.
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(1989)
Trans. Jpn. Soc. Mech. Eng., Ser. A
, vol.55
, Issue.510
, pp. 356-363
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Kitano, M.1
Kawai, S.2
Nishimura, A.3
Nishi, K.4
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7
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0025477230
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A stress singularity parameter approach for evaluating reliability of LSI plastic package
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Hattori, T., Nishimura, A., and Murakami, G., 1990, "A Stress Singularity Parameter Approach for Evaluating Reliability of LSI Plastic Package" J. Soc. Mater. Sci. Jpn., 39(443), pp. 1101-1105.
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(1990)
J. Soc. Mater. Sci. Jpn.
, vol.39
, Issue.443
, pp. 1101-1105
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Hattori, T.1
Nishimura, A.2
Murakami, G.3
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8
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0026106163
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Stress fields near the corner of jointed dissimilar materials
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(in Japanese)
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Chen, D., and Nishitani, H., 1991, "Stress Fields Near the Corner of Jointed Dissimilar Materials" (in Japanese), Trans. Jpn. Soc. Mech. Eng., Ser. A, 57, No. 534, pp. 366-372.
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(1991)
Trans. Jpn. Soc. Mech. Eng., Ser. A
, vol.57
, Issue.534
, pp. 366-372
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Chen, D.1
Nishitani, H.2
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9
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0342610315
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Strength evaluation of V-notches in electronic plastic packages using stress intensity factors of V-notch
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Ikeda, T., Arase, I., Ueno, U., and Miyazaki, M., 1998, "Strength evaluation of V-notches in electronic plastic packages using stress intensity factors of V-notch," Proc., ICES '98, Modeling and Simulation Based Engineering, Vol. I, pp. 965-970.
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(1998)
Proc., ICES '98, Modeling and Simulation Based Engineering
, vol.1
, pp. 965-970
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Ikeda, T.1
Arase, I.2
Ueno, U.3
Miyazaki, M.4
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