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Volumn 125, Issue 1, 2003, Pages 31-38

Strength evaluation of plastic packages during solder reflow process using stress intensity factors of V-notch

Author keywords

[No Author keywords available]

Indexed keywords

CRACK INITIATION; DISSIMILAR MATERIALS; ESTIMATION; EVALUATION; EXTRAPOLATION; FINITE ELEMENT METHOD; MOISTURE; SOLDERING; STRENGTH OF MATERIALS; STRESS INTENSITY FACTORS; THREE DIMENSIONAL; VAPOR PRESSURE;

EID: 0344982116     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1525244     Document Type: Article
Times cited : (6)

References (9)
  • 1
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    • (in Japanese)
    • Nishimura, A., Hirose, I., and Tnanaka, N., 1993, "A New Method for Measuring Adhesion Strength of IC Molding Compounds" (in Japanese), Trans. Jpn. Soc. Mech. Eng., Ser. A, 59(559), pp. 620-626.
    • (1993) Trans. Jpn. Soc. Mech. Eng., Ser. A , vol.59 , Issue.559 , pp. 620-626
    • Nishimura, A.1    Hirose, I.2    Tnanaka, N.3
  • 2
    • 0028515369 scopus 로고
    • Measurement of IC molding compound adhesion strength and prediction of interface delamination within package
    • (in Japanese)
    • Tanaka, N., and Nishiura, A., 1994, "Measurement of IC Molding Compound Adhesion Strength and Prediction of Interface Delamination Within Package" (in Japanese), Trans. Jpn. Soc. Mech. Eng., Ser. A, 60(577), pp. 1992-1999.
    • (1994) Trans. Jpn. Soc. Mech. Eng., Ser. A , vol.60 , Issue.577 , pp. 1992-1999
    • Tanaka, N.1    Nishiura, A.2
  • 3
    • 5844362916 scopus 로고    scopus 로고
    • Measurement of mixed mode fracture toughness of an interface crack in electronic devises
    • Ikeda, T., Komohara, Y., and Miyazaki, N., 1997, "Measurement of Mixed Mode Fracture Toughness of an Interface Crack in Electronic Devises," Advances in Electronic Packaging, ASME EEP-Vol. 19, No. 2, pp. 1137-1444.
    • (1997) Advances in Electronic Packaging, ASME , vol.EEP-Vol. 19 , Issue.2 , pp. 1137-1444
    • Ikeda, T.1    Komohara, Y.2    Miyazaki, N.3
  • 4
    • 0023560046 scopus 로고
    • Life estimation for IC plastic packages under temperature cycling based on fracture mechnics
    • Nishimura, A., Tatemichi, A., Miura, H., and Sakamoto, T., 1987, "Life Estimation for IC Plastic Packages under Temperature Cycling Based on Fracture Mechnics," IEEE Trans. Compon., Hybrids, Manuf. Technol., CHMT-12, No. 4, pp. 637-642.
    • (1987) IEEE Trans. Compon., Hybrids, Manuf. Technol. , vol.CHMT-12 , Issue.4 , pp. 637-642
    • Nishimura, A.1    Tatemichi, A.2    Miura, H.3    Sakamoto, T.4
  • 5
    • 0024905052 scopus 로고
    • Effect of lead frame material on plastic-encapsulated IC package cracking under temperature cycling
    • Nishimura, A., Kawai, S., and Murakami, G., 1989, "Effect of Lead Frame Material on Plastic-Encapsulated IC Package Cracking Under Temperature Cycling," IEEE Trans. Compon., Hybrids, Manuf. Technol., 12, No. 4, pp. 639-645.
    • (1989) IEEE Trans. Compon., Hybrids, Manuf. Technol. , vol.12 , Issue.4 , pp. 639-645
    • Nishimura, A.1    Kawai, S.2    Murakami, G.3
  • 6
    • 0024607410 scopus 로고
    • A study of package cracking during the reflow soldering process
    • (in Japanese)
    • Kitano, M., Kawai, S., Nishimura, A., and Nishi, K., 1989, "A Study of Package Cracking During the Reflow Soldering Process" (in Japanese), Trans. Jpn. Soc. Mech. Eng., Ser. A, 55(510), pp. 356-363.
    • (1989) Trans. Jpn. Soc. Mech. Eng., Ser. A , vol.55 , Issue.510 , pp. 356-363
    • Kitano, M.1    Kawai, S.2    Nishimura, A.3    Nishi, K.4
  • 7
    • 0025477230 scopus 로고
    • A stress singularity parameter approach for evaluating reliability of LSI plastic package
    • Hattori, T., Nishimura, A., and Murakami, G., 1990, "A Stress Singularity Parameter Approach for Evaluating Reliability of LSI Plastic Package" J. Soc. Mater. Sci. Jpn., 39(443), pp. 1101-1105.
    • (1990) J. Soc. Mater. Sci. Jpn. , vol.39 , Issue.443 , pp. 1101-1105
    • Hattori, T.1    Nishimura, A.2    Murakami, G.3
  • 8
    • 0026106163 scopus 로고
    • Stress fields near the corner of jointed dissimilar materials
    • (in Japanese)
    • Chen, D., and Nishitani, H., 1991, "Stress Fields Near the Corner of Jointed Dissimilar Materials" (in Japanese), Trans. Jpn. Soc. Mech. Eng., Ser. A, 57, No. 534, pp. 366-372.
    • (1991) Trans. Jpn. Soc. Mech. Eng., Ser. A , vol.57 , Issue.534 , pp. 366-372
    • Chen, D.1    Nishitani, H.2
  • 9
    • 0342610315 scopus 로고    scopus 로고
    • Strength evaluation of V-notches in electronic plastic packages using stress intensity factors of V-notch
    • Ikeda, T., Arase, I., Ueno, U., and Miyazaki, M., 1998, "Strength evaluation of V-notches in electronic plastic packages using stress intensity factors of V-notch," Proc., ICES '98, Modeling and Simulation Based Engineering, Vol. I, pp. 965-970.
    • (1998) Proc., ICES '98, Modeling and Simulation Based Engineering , vol.1 , pp. 965-970
    • Ikeda, T.1    Arase, I.2    Ueno, U.3    Miyazaki, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.