Critical thickness for the saturation state of strain relaxation in the InGaAs/GaAs systems

Applied Physics Letters

Volumn 72, Issue 15, 1998, Pages 1875-1877

  Gonzalez D ^a   Araujo D ^a   Aragon G ^a   Garcia R ^a  

^a UNIVERSITY OF CÁDIZ   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344980226     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121212     Document Type: Article

References (11)

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