The Dynamics of Cadmium Telluride Etching

Materials Research Society Symposium - Proceedings

Volumn 763, Issue , 2003, Pages 107-118

  Dobson, K D ^a   Paulson, P D ^a   McCandless, B E ^a   Birkmire, R W ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CONCENTRATION (PROCESS); DIFFUSION IN SOLIDS; ELLIPSOMETRY; ETCHING; GRAIN BOUNDARIES; METHANOL; OXIDATION; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; SUBSTRATES; VISCOSITY; X RAY DIFFRACTION ANALYSIS;

ACIDIC ETCHES; REFLECTION COEFFICIENTS; SURFACE FILMS;

CADMIUM ALLOYS;

EID: 0344927780     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-763-b3.1     Document Type: Conference Paper

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