Reemission intensity and energy spectrum measurements of slow positron beams for various moderators

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 9 A, 2003, Pages 5799-5806

  Sueoka, Osamu ^a   Makochekanwa, Casten ^a   Miyamoto, Satoshi ^b  

^a YAMAGUCHI UNIVERSITY   (Japan)

^b SHARP CORPORATION   (Japan)

Author keywords

Atomic force microscope (AFM); Energy spectrum; Moderator; Reemission intensity; Scanning transmission microscope (STM); Slow positron beam

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DIAMOND FILMS; ETCHING; EVAPORATION; MODERATORS; PARTICLE DETECTORS; POLISHING; POSITRONS; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; TUNGSTEN;

CERATRON DETECTORS; ENERGY SPECTRUM MEASUREMENT; REMISSION INTENSITY; SLOW POSITRON BEAMS;

ELECTRON EMISSION;

EID: 0344925539     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.5799     Document Type: Article

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