Texture-Based Paper Characterization Using Non-Supervised Clustering

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5132, Issue , 2003, Pages 350-358

  Turtinen, Markus ^a   Pietikäinen, Matti ^a   Silvén, Olli ^a   Mäenpää, Topi ^a   Niskanen, Matti ^a  

^a UNIVERSITY OF OULU   (Finland)

Author keywords

Local Binary Pattern; Quality control; Self Organizing Map; Texture analysis; Visual inspection

Indexed keywords

PAPER; QUALITY CONTROL; SELF ORGANIZING MAPS; TEXTURES; USER INTERFACES;

LOCAL BINARY PATTERN (LBP); VISUAL INSPECTION;

COMPUTER VISION;

EID: 0344899973     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.515125     Document Type: Conference Paper

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