Dipole screening regime for pyroelectric and ferroelectric films and grains in semiconductor matrix

Solid-State Electronics

Volumn 48, Issue 3, 2004, Pages 487-490

  Dmitriev, A P ^a,b   Kachorovskii, V Yu ^a,b   Shur, M S ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM SULFIDE; FERROELECTRIC MATERIALS; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; POLARIZATION; PYROELECTRICITY;

SEMICONDUCTOR MATRIX;

THIN FILMS;

EID: 0344898379     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2003.08.002     Document Type: Article

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