Negative luminescence from MWIR HgCdTe/Si devices

IEE Proceedings: Optoelectronics

Volumn 150, Issue 4, 2003, Pages 365-370

  Lindle, J R ^a   Bewley, W W ^a   Vurgaftman, I ^a   Meyer, J R ^a   Varesi, J B ^b   Johnson, S M ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED DEVICES; INFRARED SPECTROMETERS; LIGHT EMISSION; LIGHT MODULATION; LIGHT REFLECTION; LUMINESCENCE; MERCURY COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES; THERMAL EFFECTS;

ELECTRICAL MODULATION TECHNIQUE; MIDWAVE-INFRARED DEVICE; NEGATIVE LUMINESCENCE; SELF-REFERENCING TECHNIQUE;

PHOTODIODES;

EID: 0344897250     PISSN: 13502433     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-opt:20030721     Document Type: Article

References (19)

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