A review of existing national measurement standards for RF and microwave impedance parameters in the UK

IEE Colloquium (Digest)

Volumn , Issue 8, 1999, Pages 29-34

  Ridler, N M ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AIR-GAUGING SYSTEM; CALIBRATION DEVICES; LASER MICROMETER SYSTEM; MICROWAVE FREQUENCIES;

ALGORITHMS; AUTOMATION; COMPUTATIONAL GEOMETRY; DIELECTRIC MATERIALS; ELECTRIC NETWORK ANALYZERS; ELECTRIC POTENTIAL; ELECTRIC PROPERTIES; FREQUENCIES; MICROWAVES; PARAMETER ESTIMATION;

ACOUSTIC IMPEDANCE MEASUREMENT;

EID: 0344879689     PISSN: 09633308     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (11)

1. J P Ide, "Traceability for radio frequency coaxial line standards", NPL Report DES 114, July 1992.
2. G F Engen and C A Hoer, "Thru-Reflect-Line: An improved technique for calibrating the dual six-port automatic network analyser", IEEE Trans, MTT-27 (12), pp 987-993, December 1979.
3. C A Hoer and G F Engen, "On-line accuracy assessment for the dual six-port ANA: extension to nonmating connectors", IEEE Trans IM-36 (2), pp 524-529, June 1987.
4. C A Hoer, "Choosing line lengths for calibrating network analysers", IEEE Trans MTT-31 (1), pp 76-78, January 1983.
5. BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, "Guide to the expression of uncertainty in measurement", International Organization for Standardization, Geneva, Switzerland. ISBN 92-67-10188-9, 1st edition 1993.
6. N M Ridler, "VHP impedance - a review", NPL Report DES 127, November 1993.
7. N M Ridler, "Improved RF calibration techniques for network analyzers and reflectometers", Microwave Engineering Europe, pp 35-39, October 1993.
8. N M Ridler and J C Medley, "Improving the traceability of coaxial impedance measurements at lower RF in the UK", IEE Proc-Sci Meas Technol 143 (4), pp 241-245, July 1996.
9. N M Ridler and J C Medley, "An uncertainty budget for VHP and UHF reflectometers", NPL Report DES 120, May 1992.
10. M G Cox, M P Dainton, P M Harris, N M Ridler and P R Young, "A generalised treatment of the uncertainty in calibration and measurement for vector-indicating microwave reflectometers", 2nd International Workshop on Advanced Mathematical Methods in Measurement and Instrumentation, Villa Olmo, Como, Italy, 8-10 July 1998.
11. N M Ridler and P R Young, "Towards traceability to UK national standards for complex reflection coefficient parameters at lower RF", 27th Automated RF and Microwave Measurements Society (ARMMS) Conference Digest, National Physical Laboratory, Teddington, 25th and 26th April 1998.