Variation of hydrogen bonded O...O distances in goethite at high pressure

American Mineralogist

Volumn 88, Issue 10, 2003, Pages 1423-1427

  Nagai, Takaya ^a   Kagi, Hiroyuki ^b   Yamanaka, Takamitsu ^a  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN BONDS; RIETVELD ANALYSIS; X RAY POWDER DIFFRACTION;

COMPRESSION BEHAVIOR; DIAMOND-ANVIL CELL; HIGH PRESSURE; IN-SITU SYNCHROTRONS; PRESSURE MEDIUM; SECOND ORDERS; UNIT-CELL VOLUME;

CRYSTAL STRUCTURE;

COMPRESSION; CRYSTAL STRUCTURE; GOETHITE; HIGH PRESSURE; HYDROGEN; X-RAY DIFFRACTION;

EID: 0344873328     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2003-1005     Document Type: Article

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