Diffraction in the high frequency regime by a thin layer of dielectric material I: the equivalent impedance boundary condition

SIAM Journal on Applied Mathematics

Volumn 59, Issue 3, 1998, Pages 1028-1052

  Lafitte, Olivier D ^a,b  

^a CEA DIF   (France)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; ELECTRIC IMPEDANCE; ELECTROMAGNETIC WAVE DIFFRACTION; MAXWELL EQUATIONS; PERMITTIVITY; THIN FILMS;

IMPEDANCE BOUNDARY CONDITIONS; MICROLOCAL ANALYSIS;

BOUNDARY CONDITIONS;

EID: 0344865672     PISSN: 00361399     EISSN: None     Source Type: Journal    
DOI: 10.1137/S0036139996307152     Document Type: Article

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