Strain fields at contacts between small particles

Journal of Colloid and Interface Science

Volumn 268, Issue 2, 2003, Pages 362-370

  Tholen A R ^a   Yao, Y ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

COHERENT PARTICLES; SURFACE FORCES;

STRAIN MEASUREMENT;

OXIDE;

ADHESION; ARTICLE; CALCULATION; CRYSTAL; EXPERIMENT; FORCE; MAGNETISM; PARTICLE SIZE; PRIORITY JOURNAL; STRESS STRAIN RELATIONSHIP; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0344825335     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2003.08.044     Document Type: Article

References (28)

1. Easterling K.E., Thölén A.R. Acta Met. 20:1972;1001.
2. Johnson K.L., Kendall K., Roberts A.D. Proc. R. Soc. A. 324:1971;301.
3. Maugis D., Pollock H.M. Acta Met. 32:(9):1984;1323-1334.
4. Hansson I., Thölén A. Phil. Mag. A. 37:(4):1978;535.
5. Thölén A.R. Acta Met. 27:1979;1765.
6. Thölén A.R. Phys. Status Solidi A. 60:1980;153.
7. Thölén A.R. Phase Transitions. 24-26:1990;375.
8. Rimai D.S., DeMejo L.P. Annu. Rev. Mater. Sci. 26:1996;21-41.
9. Gryaznov V.G., Tanakov M.Yu., Trusov L.I. Review. J. Mater. Sci. 27:1992;4829-4841.
10. Yeadon M., Ghaly M., Yang J.C., Averbach R.S., Gibson J.M. Appl. Phys. Lett. 73:(22):1998;3208-3210.
11. Kramer D., Huang H., Kriese M., Robach J., Nelson J., Wright A., Bahr D., Gerbereich W.W. Acta Mater. 47:1999;333-343.
12. Giannakopoulus A.E., Venkatesh T.A., Lindley T.C., Suresh S. Acta Mater. 47:1999;4653-4664.
13. Yao Y., Thölén A.R. Nanotechnology. 13:2002;169-174.
14. Yao Y., Thölén A.R. Micros. Microanal. 9:2003;237-244.
15. Timoshenko S., Goodier J.N. Theory of Elasticity. Engineering Societies Monographs. 1951;McGraw-Hill, New York.
16. Johnson K.L. Contact Mechanics. 1985;Cambridge Univ. Press, Cambridge, UK.
17. Vitos L., Ruban A.V., Skriver H.L., Kollár J. Surf. Sci. 411:1998;186-202.
18. Cherns D., Kiely C.J., Preston A.R. Ultramicroscopy. 24:1988;355-370.
19. Kret S., Delamarre C., Laval J.Y., Dubon A. Phil. Mag. Lett. 77:(5):1998;249-256.
20. Tibault J., Bayle-Guillemaud P., Dressler C. Proc. SCANDEM 2001, Stockholm. 2001;72.
21. Nordlander I., Thölén A. J. Microsc. 98:(2):1973;221.
22. Eshelby J.W. Proc. R. Soc. A. 241:1957;376.
23. Ashby M.F., Brown L.M. Phil. Mag. 8:1963;1083.
24. Spence J.C.H., Zuo J.M. Electron Microdiffraction. 1992;Plenum, New York/London.
25. Thölén A.R. Phil. Mag. 22:(175):1970;175.
26. Janssens K.G.F., Vanhellemont J., De Graef M., der Biest O.V. Ultramicroscopy. 45:1992;323-335.
27. Janssens K.G.F., der Biest O.V., Vanhellemont J., Maes H.E. Ultramicroscopy. 69:1997;151-167.
28. Hirth J.P., Lothe J. Theory of Dislocations. 1968;McGraw-Hill, New York.